Advanced Laser Diode Reliability
Béchou, Laurent
Fukuda, Mitsuo
Mura, Giovanna
Vanzi, Massimo
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. The book reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections support this kernel: a) failure analysis techniques, procedures and examples; and, b) device-oriented laser modeling and parameter extraction. Provides natural continuity with the most widespread existing textbooksOffers an extension to new failure mechanisms, new technologies, new application fields and new environmentsIntroduces a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantitiesIntroduces and explores the application of a practical measurement tool for linking failure modes to failure mechanisms INDICE: 1. State of the Art of Laser Diodes 2. Electrical and Optical Models 3. Methods for Design for Reliability Investigation 4. Laser Diode Reliability
- ISBN: 978-1-78548-154-3
- Editorial: ISTE Press - Elsevier
- Encuadernacion: Cartoné
- Páginas: 200
- Fecha Publicación: 01/09/2017
- Nº Volúmenes: 1
- Idioma: Inglés