Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre–Richard
Pougnet, Philippe
El Hami, Abdelkhalak
108,58 €(IVA inc.)
INDICE: Chapter 1 Multivariate Statistical Principal Component Analysis (PCA) .Chapter 2 Reliability Optimization of Systems .Chapter 3 Wave–Particle Nature of Light .Chapter 4 Polarisation States of Light .Chapter 5 Interaction of Light and Matter .Chapter 6 Experimental Techniques with Polarized Light .Chapter 7 Defects in Heterogeneous Media of Model Systems .Chapter 8 Defects at Interfaces .Chapter 9 Application to Nanomaterials
- ISBN: 978-1-84821-936-6
- Editorial: ISTE Ltd.
- Encuadernacion: Cartoné
- Páginas: 316
- Fecha Publicación: 04/10/2016
- Nº Volúmenes: 1
- Idioma: Inglés