"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
- ISBN: 9780824706005
- Editorial: MARCEL DEKKER, INC. (NEW YORK)
- Encuadernacion: Tela
- Páginas: 1016
- Fecha Publicación: 27/11/2001
- Nº Volúmenes: 1
- Idioma: