Understanding atomic force microscopy: basic modes for advanced applications
Haugstad, Greg
143,42 €(IVA inc.)
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data froman atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.
- ISBN: 978-0-470-63882-8
- Editorial: John Wiley & Sons
- Encuadernacion: Tela
- Páginas: 496
- Fecha Publicación: 01/10/2012
- Nº Volúmenes: 1
- Idioma: Inglés