This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
- ISBN: 978-981-10-7469-1
- Editorial: Springer
- Encuadernacion: Rústica
- Páginas: 815
- Fecha Publicación: 22/12/2017
- Nº Volúmenes: 1
- Idioma: Inglés