This book will offer comprehensive descriptions of the most important techniques so far proposed for short-range microwave imaging (including reconstruction procedures, imaging systems and apparatuses, and current applications). In addition, it will include a review of the inverse scattering problem formulation written from an engineering perspective and notations. The most effective reconstruction techniques based on diffracted waves will be covered including time- and frequency-domain methods, as well as deterministic and stochastic space-domain procedures. A comprehensive review will be also devoted to currently proposed imaging apparatuses, aimed at fast and accurate measurements of the scattered field data. The design and realization of near field probes, microwave axial tomographs, microwave cameras and scanners will be discussed with reference to the major practical solutions so far proposed. Finally, there will bea discussion of practical applications with detailed descriptions and discussions of several specific examples (e.g., materials evaluation, crack detection, inspection of civil and industrial structures, antenna diagnostics, subsurface detection, medical applications).Matteo Pastorino received the ‘laurea degree’ in Electronic Engineering from the University of Genoa in 1987 and the Ph.D. degree in Electronic Engineeringand Computer Science from the same university in 1992. At present, he is a professor of Electromagnetic Fields and the director of the Applied Electromagnetics Group of the Department of Biophysical and Electronic Engineering, University of Genoa, Italy. Prof. Pastorino teaches the university courses of ‘Electromagnetic Fields,’ ‘Remote Sensing and Electromagnetic Diagnostics,’ and ‘Antennas and Remote Sensing.’ His main research interests are in the field of microwave and millimeter wave imaging, direct and inverse scattering problems, industrial and medical applications, smart antennas, and analytical and numerical methods in electromagnetism. He is co-author of more than 300 papers in international journals and proceedings of conferences
- ISBN: 978-0-470-27800-0
- Editorial: John Wiley & Sons
- Encuadernacion: Cartoné
- Páginas: 304
- Fecha Publicación: 30/04/2010
- Nº Volúmenes: 1
- Idioma: Inglés