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362,96€(IVA inc.)
Springer handbook of metrology and testing
- Czichos, Horst
- 978-3-642-16640-2
- 2011-06-01
135,15€(IVA inc.)
Distributed large-scale dimensional metrology: new insights
- Franceschini, Fiorenzo
- 978-0-85729-542-2
- 2011-06-01
145,55€(IVA inc.)
Thermomechanics and infra-red imaging: Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics v. 7
- Proulx, Tom
- 978-1-4614-0206-0
- 2011-05-22
58,24€(IVA inc.)
Advances in power electronics and instrumentationengineering: Second International Conference, PEIE 2011, Nagpur, Maharashtra, India, April 21-22, 2011. Proceedings
- Das, Vinu V.
- 978-3-642-20498-2
- 2011-04-13
58,49€(IVA inc.)
Fundamentals of sensors for engineering and science
- Dunn, Patrick F.
- 978-1-4398-6103-5
- 2011-04-11
97,96€(IVA inc.)
Thermal infrared sensors: theory, optimisation and practice
- Budzier, Helmut
- 978-0-470-87192-8
- 2011-01-21
26,80€(IVA inc.)
LabVIEW: entorno gráfico de programación
- Lajara Vizcaíno, José Rafael
- 978-84-267-1696-5
- 2011-01-01
124,75€(IVA inc.)
Scanning transmission electron microscopy: imaging and analysis
- Pennycook, Stephen J.
- 978-1-4419-7199-9
- 2010-12-29
266,43€(IVA inc.)
Handbook of surface and nanometrology
- Whitehouse, David J.
- 978-1-4200-8201-2
- 2010-12-06
24,00€(IVA inc.)
Instrumentación básica de medida y control
- García Gutiérrez, Luis
- 978-84-8143-709-6
- 2010-12-01