Reliability Characterisation of Electrical and Electronic Systems

This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications. Takes a holistic approach to reliability engineeringLooks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliabilityFacilitates a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation INDICE: 1 Introduction Jonathan Swingler, Heriot-Watt University, UK 2 Reliability and stupidity: mistakes in reliability engineering and how to avoid them Albertyn Barnard, Lambda Consulting, South Africa 3 Physics-of-failure methodology for electronics reliability Michael Pecht & Christopher Hendricks, University of Maryland, USA   4 Modern instruments for characterising degradation in electrical and electronic systems Paul Goodman, R. Skipper & Nick Aitken, ERA Tech., UK 5 Reliability building of discrete electronic components Titu I. Bajenescu, La Conversion, Switzerland 6 Reliability of optoelectronics Jia-Sheng Huang, Emcore, USA 7 Reliability of silicon integrated circuits Anthony Oates, TSMC, Taiwan 8 Reliability of emerging nano-devices Nagarajan Raghavan, Singapore University of Technology & Design (SUTD), Singapore & Kin Leong Pey, SUTD, Singapore 9 Design considerations for reliable embedded systems Bashir M. Al-Hashimi & Rishad Shafik, University of Southampton, UK 10 Reliability approaches for automotive electronic systems Dina Medhat, Mentor Graphics, Egypt 11 Reliability modeling and accelerated life-testing for solar power generation systems Fred Schenkelberg, FMS Reliability, USA

• ISBN: 978-1-78242-221-1
• Editorial: Woodhead Publishing
• Encuadernacion: Cartoné
• Páginas: 268
• Fecha Publicación: 31/01/2015
• Nº Volúmenes: 1
• Idioma: Inglés