This book provides an important link between the theoretical knowledge in thefield of non-linier physics and practical application problems in microelectronics. It delivers different levels of understanding of the physical phenomenathat play a critical role in limitation of the semiconductor device capabilities, physical safe operating area limitation, and different scenarios of catastrophic failures in semiconductor devices. The book focuses on power semiconductor devices and self-triggering pulsed power devices for ESD protection clamps. The purpose of the book is popularization of the physical approach for reliability assurance. Another unique aspect of the book is the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices. Provides the description and translation of cross-disciplinary phenomena for reliability assurance including circuit design, ESD design and TCAD simulation. Applies directly to the area of ESD protection design. Explains complex physical descriptions so that they can be applied to the decision making process INDICE: Transistor Failures.- Theoretical Basis of Current Instability in Transistor Structures.- Thermal Instability Mechanism.- Isothermal InstabilityMechanisms in Silicon BJT and MOSFETs.- Isothermal Instability in GaAs MESFETs and HEMTs.- Specific Conductivity Modulation in ESD Protection Devices.- Physical Approach to the Reliability Assurance and ESD Design.
- ISBN: 978-0-387-74513-8
- Editorial: Springer
- Encuadernacion: Cartoné
- Páginas: 330
- Fecha Publicación: 01/01/2008
- Nº Volúmenes: 1
- Idioma: Inglés