This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques usingthe SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists. INDICE: Techniques.- Fundamentals of Scanning Electron Microscopy (SEM).- Low Voltage and High-resolution SEM.- X-ray Microanalysis in Nanomaterials.- Backscattering Detector and EBSD in Nanomaterials Characterization.- Environmental Microscopy Application in Nanomaterials Research.- E-beam Nanolithography Integrated with SEM.- Focused Ion Beam Microscopy in Nanostructures Fabrication.- Scanning Transmission Electron Microscopy (STEM) in Nanostructure Characterization. Applications.- Quantum Nanowires and Carbon Nanotubes.- Photonic Crystals.- Nanoparticles and Colloidal Nanocrystal Self-assembly.- Nano-building Blocks Fabricated through Templates.- Oxide Nanostructures.- Biological and Bio-inspired Nanomaterials and Devices.- Nano-manipulators in-situ NanomaterialsEngineering.- Cryo- and High- Temperature Holder in Nanomaterials Research.
- ISBN: 978-1-4419-2209-0
- Editorial: Springer
- Encuadernacion: Rústica
- Páginas: 538
- Fecha Publicación: 01/02/2010
- Nº Volúmenes: 1
- Idioma: Inglés