Authored by a university professor deeply involved in X–ray diffraction–related research, this textbook is based on his lectures given during more than 20 years for graduate students. It adopts a well–balanced approach, describing basic concepts and experimental techniques, which make X–ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X–ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single–scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental laws that govern the interaction of X–rays with matter, but also covers in detail classical and modern applications, e.g., line broadening, texture and strain/stress analyses, X–ray mapping in reciprocal space, high–resolution X–ray diffraction in the spatial and wave vector domains, X–ray focusing, inelastic and time–resolved X–ray scattering. This unique scope, in combination with otherwise hard–to–find information on analytic expressions for simulating X–ray diffraction profiles in thin–film heterostructures, X–ray interaction with phonons, coherent scattering of Mössbauer radiation, and energy–variable X–ray diffraction, makes the book indispensable for any serious user of X–ray diffraction techniques. Compact and self–contained, this textbook is suitable for students taking X–ray diffraction courses towards specialization in materials science, physics, chemistry, or biology. Numerous clear–cut illustrations, an easy–to–read style of writing, as well as rather short, easily digestible chapters all facilitate comprehension. INDICE: Introduction Diffraction Phenomena in Optics Wave Propagation in Periodic Media Dynamical Diffraction of Particles and Fields: General Considerations Dynamical X–Ray Diffraction: the Ewald–Laue Approach Dynamical X–Ray Diffraction: the Darwin Approach Dynamical X–Ray Diffraction in Non–Homogeneous Structures: the Takagi–Taupin Approach X–Ray Absorption Dynamical Diffraction in Single Scattering Approximation: Application to High–Resolution X–Ray Diffraction in Heterostructures and Multilayers X–Ray Mapping in Reciprocal Space and Strain Measurements X–Ray Diffraction in Kinematic Approximation X–Ray Diffraction in Polycrystalline Materials Applications to Materials Science: Structure Analysis Applications to Materials Science: Phase Analysis Applications to Materials Science: Preferred Orientation Analysis Applications to Materials Science: Line Broadening Analysis Applications to Materials Science: Measurements of Residual Strain/Stresses Impact of Lattice Defects on X–Ray Diffraction X–Ray Diffraction Measurements in Polycrystalline Materials with High Spatial Resolution Inelastic Scattering Interaction of X–Rays with Acoustic Waves Time–resolved X–Ray Scattering X–Ray Sources X–Ray Focusing Optics X–Ray Diffractometers
- ISBN: 978-3-527-33561-9
- Editorial: Wiley VCH
- Encuadernacion: Rústica
- Páginas: 304
- Fecha Publicación: 19/03/2014
- Nº Volúmenes: 1
- Idioma: Inglés